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Apparatus and method for detecting outliers in cyber-physical systems

Authors

Simon S. Woo, Young Geun Kim

Published

November 2023

Type

Patent

Publication

Korean patents (1026080180000)

Links

DOI  pdf  code

Abstract
(Translated by kipris) The present invention provides an abnormal value detection device of a cyber-physical system which comprises: a learning module that learns a self-organization map by learning multivariate time series data; a calculation module that calculates a distance function between a codebook matrix output of the self-organization map and real-time data and replaces the distance function with a Frobenius norm to calculate statistics when inputting the real-time data; and a detection module that detects an abnormal value of the real-time data by performing real-time multiple testing on the statistics.COPYRIGHT KIPO 2024

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