Apparatus and method for detecting outliers in cyber-physical systems

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Abstract

(Translated by kipris) The present invention provides an abnormal value detection device of a cyber-physical system which comprises: a learning module that learns a self-organization map by learning multivariate time series data; a calculation module that calculates a distance function between a codebook matrix output of the self-organization map and real-time data and replaces the distance function with a Frobenius norm to calculate statistics when inputting the real-time data; and a detection module that detects an abnormal value of the real-time data by performing real-time multiple testing on the statistics.COPYRIGHT KIPO 2024

Publication
Korean patents (1026080180000)

Woo, Simon S, and Young Geun Kim. 2023. Apparatus and method for detecting outliers in cyber-physical systems. 1026080180000, issued November 27, 2023. https://doi.org/https://doi.org/10.8080/1020220003261.

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Young Geun Kim
Young Geun Kim
Ph.D. in Statistics

Ph.D. in Statistics